Ion bombardment in a normal-gate FED

Ion bombardment in a normal-gate FED

Yingbin Gao, Xiaobing Zhang, Wei Lei, Min Liu, Yuning Zhang, Daniel den Engelsen
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Volume:
243
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2004.06.097
File:
PDF, 316 KB
english, 2005
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