Ion bombardment in a normal-gate FED
Yingbin Gao, Xiaobing Zhang, Wei Lei, Min Liu, Yuning Zhang, Daniel den EngelsenVolume:
243
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2004.06.097
File:
PDF, 316 KB
english, 2005