Characterization of the electrical and magnetic properties...

Characterization of the electrical and magnetic properties of sub-micron MTJ cells using scanning probe microscope interfaced with an external magnetic field generator

Jinhee Heo, Deoksu Kim, SeungBae Park, Taewan Kim, Ilsub Chung
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Volume:
237
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.apsusc.2004.06.154
File:
PDF, 390 KB
english, 2004
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