SQUID systems for non-destructive testing by AC field...

SQUID systems for non-destructive testing by AC field mapping

Cochran, A., Morgan, L.N.C., Bowman, R.M., Kirk, K.J., Donaldson, G.B.
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Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233584
Date:
March, 1993
File:
PDF, 552 KB
english, 1993
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