![](/img/cover-not-exists.png)
SQUID systems for non-destructive testing by AC field mapping
Cochran, A., Morgan, L.N.C., Bowman, R.M., Kirk, K.J., Donaldson, G.B.Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233584
Date:
March, 1993
File:
PDF, 552 KB
english, 1993