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Optical properties of rough LaNiO3 thin films studied by...

Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry

Jan Mistrik, Tomuo Yamaguchi, Daniel Franta, Ivan Ohlidal, Gu Jin Hu, Ning Dai
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Volume:
244
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2004.09.151
File:
PDF, 112 KB
english, 2005
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