Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
Jan Mistrik, Tomuo Yamaguchi, Daniel Franta, Ivan Ohlidal, Gu Jin Hu, Ning DaiVolume:
244
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2004.09.151
File:
PDF, 112 KB
english, 2005