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Random and channeled ion-damage distributions in Zn + implanted GaAs by electron microscopy
Vitali, G., Consalvi, G., Rossi, M., Pizzuto, C., Zollo, G., Kalitzova, M.Volume:
132
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420159408219252
Date:
September, 1994
File:
PDF, 1.69 MB
english, 1994