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Factors affecting phase and height contrast of diblock copolymer PS–b-PEO thin films in dynamic force mode atomic force microscopy
H. Wang, A.B. Djurišić, W.K. Chan, M.H. XieVolume:
252
Year:
2005
Language:
english
Pages:
9
DOI:
10.1016/j.apsusc.2005.02.034
File:
PDF, 481 KB
english, 2005