[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - An investigation of single- and multi-finger nMOSFETs for the output pin ESD protection in integrated circuits
Shen-Li Chen,, Guan-Jhong Chen,, Wu, B.-L., Chen, Po-Yin, Chen, H.-H.Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734541
File:
PDF, 5.52 MB
english, 2008