Toward Fast Calibration of Global Drift in Scanning...

International Journal of Optomechatronics 2012 / 01 Vol. 6; Iss. 1

Toward Fast Calibration of Global Drift in Scanning Electron Microscopes with Respect to Time and Magnification

Malti, Abed C., Dembélé, Sounkalo, Piat, Nadine, Arnoult, Claire, Marturi, Naresh
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6
Language:
english
Journal:
International Journal of Optomechatronics
DOI:
10.1080/15599612.2012.663462
Date:
January, 2012
File:
PDF, 1.82 MB
english, 2012
Conversion to is in progress
Conversion to is failed