Interface characterization and indium content of...

Applied Surface Science 2006 Vol. 252; Iss. 11

Interface characterization and indium content of indium-rich quantum dots in InGaN/GaN multiple quantum wells

Chuan-Pu Liu, Yen-Lin Lai, Zheng-Quan Chen
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Volume:
252
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2005.09.024
File:
PDF, 585 KB
english, 2006
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