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Determination of optical properties in nanostructured thin films using the Swanepoel method
J. Sánchez-González, A. Díaz-Parralejo, A.L. Ortiz, F. GuiberteauVolume:
252
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2005.11.009
File:
PDF, 192 KB
english, 2006