Modeling the back gate effects of AlGaN/GaN HEMTs
Wang, Li, Zhang, Xuefeng, You, Guanjun, Xiong, Feng, Liang, Lixin, Hu, Yong, Chen, Aping, Liu, Jie, Xu, JianVolume:
13
Language:
english
Journal:
Journal of Computational Electronics
DOI:
10.1007/s10825-014-0603-y
Date:
December, 2014
File:
PDF, 281 KB
english, 2014