[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - False surface-trap signatures induced by buffer traps in AlGaN-GaN HEMTs
Verzellesi, G., Faqir, M., Chini, A., Fantini, F., Meneghesso, G., Zanoni, E., Danesin, F., Zanon, F., Rampazzos, F., Marino, F.A., Cavallini, A., Castaldini, A.Year:
2009
Language:
english
DOI:
10.1109/irps.2009.5173339
File:
PDF, 486 KB
english, 2009