On the use of response surface methodology to predict and...

On the use of response surface methodology to predict and interpret the preferred c-axis orientation of sputtered AlN thin films

J. Adamczyk, N. Horny, A. Tricoteaux, P.-Y. Jouan, M. Zadam
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Volume:
254
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.apsusc.2007.07.139
File:
PDF, 627 KB
english, 2008
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