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Measurement and calculation of charge deposition in a silicon diode irradiated by 30 MeV protons
S. Rocheman, F. Wrobel, F. Saigné, J. Vaillé, C. Weulersse, N. Buard, F. Miller, T. CarrièreYear:
2008
Language:
english
DOI:
10.1063/1.2990072
File:
PDF, 469 KB
english, 2008