[IEEE 2012 Annual IEEE India Conference (INDICON) - Kochi,...

  • Main
  • [IEEE 2012 Annual IEEE India Conference...

[IEEE 2012 Annual IEEE India Conference (INDICON) - Kochi, India (2012.12.7-2012.12.9)] 2012 Annual IEEE India Conference (INDICON) - Theoretical investigation of back gate bias effect on the electrostatic integrity of Insulated Shallow Extension Silicon On Void (ISESOV) MOSFET

Kumari, Vandana, Gupta, Mridula, Bhushan, Neha, Saxena, Manoj, Gupta, R. S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/indcon.2012.6420706
File:
PDF, 741 KB
english, 2012
Conversion to is in progress
Conversion to is failed