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[IEEE 2012 Annual IEEE India Conference (INDICON) - Kochi, India (2012.12.7-2012.12.9)] 2012 Annual IEEE India Conference (INDICON) - Theoretical investigation of back gate bias effect on the electrostatic integrity of Insulated Shallow Extension Silicon On Void (ISESOV) MOSFET
Kumari, Vandana, Gupta, Mridula, Bhushan, Neha, Saxena, Manoj, Gupta, R. S.Year:
2012
Language:
english
DOI:
10.1109/indcon.2012.6420706
File:
PDF, 741 KB
english, 2012