The switch of the worst case on NBTI and hot-carrier...

Applied Surface Science 2008 Vol. 254; Iss. 19

The switch of the worst case on NBTI and hot-carrier reliability for 0.13 μm pMOSFETs

Chia-Hao Tu, Shuang-Yuan Chen, Meng-Hong Lin, Mu-Chun Wang, Ssu-Han Wu, Sam chou, Joe Ko, Heng-Sheng Huang
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Volume:
254
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2008.02.181
File:
PDF, 822 KB
english, 2008
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