![](/img/cover-not-exists.png)
[IEEE 2010 8th International Vacuum Electron Sources Conference and Nanocarbon (IVESC) - Nanjing, China (2010.10.14-2010.10.16)] 2010 8th International Vacuum Electron Sources Conference and Nanocarbon - Electrostatic focusing Spindt-type FEA for image sensor with HARP target
Honda, Y., Nanba, M., Takiguchi, Y., Egami, N., Saishu, Y., Nakamura, K., Taniguchi, M.Year:
2010
Language:
english
DOI:
10.1109/ivesc.2010.5644391
File:
PDF, 348 KB
english, 2010