Origins of hole traps in hydrogenated nanocrystalline and...

Physical Review B 2014 / 3 Vol. 89; Iss. 11

Origins of hole traps in hydrogenated nanocrystalline and amorphous silicon revealed through machine learning

Mueller, Tim, Johlin, Eric, Grossman, Jeffrey C.
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Volume:
89
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.89.115202
Date:
March, 2014
File:
PDF, 2.56 MB
english, 2014
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