Metal–semiconductor interface in extreme temperature conditions
L.P. Bulat, I.A. Erofeeva, Yu.V. Vorobiev, J. González-HernándezVolume:
255
Year:
2008
Language:
english
Pages:
3
DOI:
10.1016/j.apsusc.2008.07.007
File:
PDF, 115 KB
english, 2008