XPS and ToF-SIMS analysis of natural rubies and sapphires...

XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5 mol% H2/Ar) atmosphere

S. Achiwawanich, B.D. James, J. Liesegang
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Volume:
255
Year:
2008
Language:
english
Pages:
12
DOI:
10.1016/j.apsusc.2008.07.161
File:
PDF, 3.34 MB
english, 2008
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