[IEEE 2010 International Conference on Information and Automation (ICIA) - Harbin, China (2010.06.20-2010.06.23)] The 2010 IEEE International Conference on Information and Automation - Defect identification and classification of multi-frequency eddy current test based on spectrum method
Gao, Junzhe, Pan, Mengchun, Luo, FeiluYear:
2010
Language:
english
DOI:
10.1109/icinfa.2010.5512024
File:
PDF, 189 KB
english, 2010