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Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects
Diercks, David R., Gorman, Brian P., Kirchhofer, Rita, Sanford, Norman, Bertness, Kris, Brubaker, MattVolume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4830023
File:
PDF, 1.97 MB
english, 2013