Ellipsometry porosimetry (EP): Thin film porosimetry by...

Applied Surface Science 2009 Vol. 256; Iss. 3-supp-S

Ellipsometry porosimetry (EP): Thin film porosimetry by coupling an adsorption setting with an optical measurement, highlights on diffusion results

A. Bourgeois, Y. Turcant, Ch. Walsh, Ch. Defranoux
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Volume:
256
Year:
2009
Language:
english
Pages:
1
DOI:
10.1016/j.apsusc.2009.06.131
File:
PDF, 635 KB
english, 2009
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