[IEEE IECON 2013 - 39th Annual Conference of the IEEE...

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[IEEE IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society - Vienna, Austria (2013.11.10-2013.11.13)] IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society - Surface damage inspection of E-shaped magnetic core elements using K-tSL-center clustering method

Gao, Huijun, Mei, Jiangyuan, Changxing Ding,, Chunwei Song,
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Year:
2013
Language:
english
DOI:
10.1109/iecon.2013.6699521
File:
PDF, 1.75 MB
english, 2013
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