X-ray photoelectron diffraction of NiO: Experiments and calculations in an extended single-scattering-cluster model
Scharfschwerdt, C., Liedtke, T., Neumann, M., Straub, T., Steiner, P.Volume:
48
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.48.6919
Date:
September, 1993
File:
PDF, 390 KB
english, 1993