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Parametrization of optical properties of indium–tin–oxide thin films by spectroscopic ellipsometry: Substrate interfacial reactivity
M. Losurdo, M. Giangregorio, P. Capezzuto, G. Bruno, R. De Rosa, F. Roca, C. Summonte, J. Plá, R. RizzoliYear:
2002
Language:
english
DOI:
10.1116/1.1421596
File:
PDF, 762 KB
english, 2002