Exploiting Symmetry in Fan Beam CT: Overcoming Third...

SIAM Journal on Applied Mathematics 2005 / 01 Vol. 65; Iss. 3

Exploiting Symmetry in Fan Beam CT: Overcoming Third Generation Undersampling

Izen, Steven H., Rohler, David P., A., Sastry KL
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Volume:
65
Language:
english
Journal:
SIAM Journal on Applied Mathematics
DOI:
10.1137/s0036139902417001
Date:
January, 2005
File:
PDF, 344 KB
english, 2005
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