Characterization of single-crystalline In2O3 films...

Applied Surface Science 2010 Vol. 257; Iss. 2

Characterization of single-crystalline In2O3 films deposited on Y-stabilized ZrO2 (1 0 0) substrates by MOCVD

Lingyi Kong, Jin Ma, Fan Yang, Zhen Zhu, Caina Luan, Hongdi Xiao
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Volume:
257
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2010.07.024
File:
PDF, 348 KB
english, 2010
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