Tunneling magnetoresistance in exchange-biased CoFeB/AlOx/Co/IrMn junctions
Yuan-Tsung Chen, Jiun-Yi Tseng, S.U. Jen, T.L. Tsai, Y.D. YaoVolume:
257
Year:
2010
Language:
english
Pages:
3
DOI:
10.1016/j.apsusc.2010.08.077
File:
PDF, 327 KB
english, 2010