Correlation between the results of charge deep-level...

Physical Review B 2002 / 11 Vol. 66; Iss. 19

Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

Nádaždy, V., Durný, R., Thurzo, I., Pinčík, E., Nishida, A., Shimizu, J., Kumeda, M., Shimizu, T.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
66
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.66.195211
Date:
November, 2002
File:
PDF, 130 KB
english, 2002
Conversion to is in progress
Conversion to is failed