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Thickness study of Al:ZnO film for application as a window layer in Cu(In1−xGax)Se2 thin film solar cell
M.M.Islam, S. Ishizuka, A. Yamada, K. Matsubara, S. Niki, T. Sakurai, K. AkimotoVolume:
257
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2010.11.169
File:
PDF, 753 KB
english, 2011