Combination of optical and X-ray techniques in the study of...

High Pressure Research 2010 / 03 Vol. 30; Iss. 1

Combination of optical and X-ray techniques in the study of amorphous semiconductors under high pressure: an upgrade setup for combined XAS and XRD measurements

Coppari, F., Di Cicco, A., Principi, E., Trapananti, A., Pinto, N., Polian, A., Chagnot, S., Congeduti, A.
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Volume:
30
Language:
english
Journal:
High Pressure Research
DOI:
10.1080/08957950903549501
Date:
March, 2010
File:
PDF, 428 KB
english, 2010
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