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In situ X-ray photoelectron spectroscopy characterization of Al2O3/GaSb interface evolution
S. McDonnell, D.M. Zhernokletov, A.P. Kirk, J. Kim, R.M. WallaceVolume:
257
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2011.05.034
File:
PDF, 518 KB
english, 2011