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Defect formation and crossover behavior in the dynamic scaling properties of molecular-beam epitaxy
Das Sarma, S., Lanczycki, C. J., Ghaisas, S. V., Kim, J. M.Volume:
49
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.49.10693
Date:
April, 1994
File:
PDF, 347 KB
english, 1994