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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Single image spectral electroluminescence (photon emission) of GaN HEMTs
Scholz, P., Glowacki, A., Kerst, U., Boit, C., Ivo, P., Lossy, R., Wurfl, H.-J, Yokoyama, Y.Year:
2013
Language:
english
DOI:
10.1109/irps.2013.6532060
File:
PDF, 1.67 MB
english, 2013