measured with high-resolution inelastic x-ray scattering

Physical Review B 2007 / 11 Vol. 76; Iss. 17

measured with high-resolution inelastic x-ray scattering

Graf, Jeff, d’Astuto, Matteo, Giura, Paola, Shukla, Abhay, Saini, Naurang L., Bossak, Alexei, Krisch, Michael, Cheong, Sang-Wook, Sasagawa, Takao, Lanzara, Alessandra
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Volume:
76
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.76.172507
Date:
November, 2007
File:
PDF, 219 KB
english, 2007
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