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Determination of the trap energy levels and the emitter area dependence of noise in polyemitter bipolar junction transistors from generation–recombination noise spectra
Ng, A., Deem, M. J., Ilowski, JohnVolume:
70
Language:
english
Journal:
Canadian Journal of Physics
DOI:
10.1139/p92-152
Date:
October, 1992
File:
PDF, 546 KB
english, 1992