[IEEE 2007 IEEE Conference on Computer Vision and Pattern...

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[IEEE 2007 IEEE Conference on Computer Vision and Pattern Recognition - Minneapolis, MN, USA (2007.06.17-2007.06.22)] 2007 IEEE Conference on Computer Vision and Pattern Recognition - Statistical Shape Analysis of Multi-Object Complexes

Gorczowski, Kevin, Styner, Martin, Jeong, Ja-Yeon, Marron, J. S., Piven, Joseph, Hazlett, Heather Cody, Pizer, Stephen M., Gerig, Guido
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Year:
2007
Language:
english
DOI:
10.1109/cvpr.2007.383336
File:
PDF, 587 KB
english, 2007
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