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[IEEE 2008 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2008.11.10-2008.11.13)] 2008 IEEE/ACM International Conference on Computer-Aided Design - Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits
Li, Yiming, Hwang, Chih-Hong, Ta-Ching Yeh,, Tien-Yeh Li,Year:
2008
Language:
english
DOI:
10.1109/iccad.2008.4681586
File:
PDF, 1.18 MB
english, 2008