[IEEE 2008 IEEE/ACM International Conference on...

  • Main
  • [IEEE 2008 IEEE/ACM International...

[IEEE 2008 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2008.11.10-2008.11.13)] 2008 IEEE/ACM International Conference on Computer-Aided Design - Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits

Li, Yiming, Hwang, Chih-Hong, Ta-Ching Yeh,, Tien-Yeh Li,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/iccad.2008.4681586
File:
PDF, 1.18 MB
english, 2008
Conversion to is in progress
Conversion to is failed