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[Japan Soc. Appl. Phys 2001 Symposium on VLSI Circuits. Digest of Technical Papers - Kyoto, Japan (14-16 June 2001)] 2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185) - Scaling trends of cosmic ray induced soft errors in static latches beyond 0.18 μ
Karnik, T., Bloechel, B., Soumyanath, K., De, V., Borkar, S.Year:
2001
Language:
english
DOI:
10.1109/vlsic.2001.934195
File:
PDF, 254 KB
english, 2001