[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - Yield-enhancement techniques for 3D random access memories
Che-Wei Chou,, Huang, Yu-Jen, Li, Jin-FuYear:
2010
Language:
english
DOI:
10.1109/vdat.2010.5496702
File:
PDF, 172 KB
english, 2010