Transmission electron microscopy investigation of Ag diffusion mechanisms in β-SiC
Coward, Robert A., Winkler, Christopher R., Hanson, William A., Jablonski, Michael L., Taheri, Mitra L.Volume:
457
Language:
english
Journal:
Journal of Nuclear Materials
DOI:
10.1016/j.jnucmat.2014.11.116
Date:
February, 2015
File:
PDF, 2.51 MB
english, 2015