Thickness-dependent void fraction of rf-sputtered amorphous...

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Thickness-dependent void fraction of rf-sputtered amorphous Ge films by spectroscopic ellipsometry

P. J. Mcmarr, J. R. Blanco, K. Vedam, R. Messier, L. Pilione
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Year:
1986
Language:
english
DOI:
10.1063/1.97157
File:
PDF, 493 KB
english, 1986
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