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Quantitative analysis of oxidative DNA damage induced by high-voltage pulsed discharge with cavitation
Kudo, Ken-ichi, Ito, Hironori, Ihara, Satoshi, Terato, HiroakiVolume:
73
Language:
english
Journal:
Journal of Electrostatics
DOI:
10.1016/j.elstat.2014.10.010
Date:
February, 2015
File:
PDF, 1.46 MB
english, 2015