A tool for pattern information extraction and defect...

A tool for pattern information extraction and defect quantification from crystal structures

Okuyan, Erhan, Okuyan, Erkan
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Volume:
187
Language:
english
Journal:
Computer Physics Communications
DOI:
10.1016/j.cpc.2014.09.017
Date:
February, 2015
File:
PDF, 300 KB
english, 2015
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