[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Enhanced Resolution Jitter Testing Using Jitter Expansion
Choi, Hyun, Han, Donghoon, Chatterjee, AbhijitYear:
2007
Language:
english
DOI:
10.1109/vts.2007.31
File:
PDF, 210 KB
english, 2007