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Identification of wheat quality using THz spectrum
Ge, Hongyi, Jiang, Yuying, Xu, Zhaohui, Lian, Feiyu, Zhang, Yuan, Xia, ShanhongVolume:
22
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.22.012533
Date:
May, 2014
File:
PDF, 1.33 MB
english, 2014