[IEEE 2010 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2010) - San Jose, CA, USA (2010.09.23-2010.09.24)] 2010 IEEE International Behavioral Modeling and Simulation Workshop - Automatic stress effects computation based on a layout generation tool for analog IC
Youssef, Stephanie, Dupuis, Damien, Iskander, Ramy, Louerat, Marie-MinerveYear:
2010
Language:
english
DOI:
10.1109/bmas.2010.6156590
File:
PDF, 1.42 MB
english, 2010