Thick and stress-free Sendust films on silicon for recording head cores
Daval, J., Bechevet, B., Arroyo, J., Valon, B., Armand, M.F., Joisten, H.Volume:
30
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.333947
Date:
January, 1994
File:
PDF, 299 KB
english, 1994