![](/img/cover-not-exists.png)
[IEEE 2006 IEEE International Symposium on Circuits and Systems - Island of Kos, Greece (21-24 May 2006)] 2006 IEEE International Symposium on Circuits and Systems - Dark Current and Noise of 100nm Thick Silicon On Sapphire CMOS Lateral PIN Photodiodes
Marwick, M.A., Tejada, F., Pouliquen, P., Culurciello, E., Strohbehn, K., Andreou, A.G.Year:
2006
Language:
english
DOI:
10.1109/iscas.2006.1693650
File:
PDF, 4.12 MB
english, 2006